T. J. Balk

Observation of giant diffusivity along dislocation cores (2008)

Legros, M., Dehm, G., Arzt, E., Balk, T. J.

Dealloying of Au-Ag thin films with a composition gradient: influence on morphology of nanoporous Au (2007)

Lu, X., Balk, T. J., Spolenak, R., Arzt, E.

Investigation of dealloying in Au-Ag thin films by quantitative electron probe microanalysis (2007)

Lu, X., Bischoff, E., Spolenak, R., Balk, T. J.

Passivation effects in copper thin films (2006)

Wiederhirn, G., Balk, T. J., Dehm, G., Nucci, J., Richter, G., Arzt, E.

Strained thin copper films as model catalysts in the materials gap (2005)

Girgsdies,F., Ressler,T., Wild,U., Wübben,T., Balk,T. J., Dehm,G., ...

Bio-mimetic scaling of mechanical of thin films, coatings, and surfaces by laser interference metallurgy (2005)

Daniel,C., Balk,T. J., Wübben,T., Mücklich,F.

Pipe-diffusion ripening of Si precipitates in Al-0.5% Cu-1%Si thin films (2005)

Legros,M., Kaouache,B., Gergaud,P., Thomas,O., Dehm,G., Balk,T. J., ...

Hillock formation and thermal stresses in thin Au films on Si substrates (2005)

Sauter,L., Balk,T. J., Dehm,G., Nucci,J. A., Arzt,E.

Strained thin copper films as model catalysts in the materials gap (2005)

Girgsdies, F., Ressler, T., Wild, U., Wübben, T., Balk, T. J., Dehm, G., ...

Bio-mimetic scaling of mechanical of thin films, coatings, and surfaces by laser interference metallurgy (2005)

Daniel, C., Balk, T. J., Wübben, T., Mücklich, F.

Pipe-diffusion ripening of Si precipitates in Al-0.5% Cu-1%Si thin films (2005)

Legros, M., Kaouache, B., Gergaud, P., Thomas, O., Dehm, G., Balk, T. J., ...

Hillock formation and thermal stresses in thin Au films on Si substrates (2005)

Sauter, L., Balk, T. J., Dehm, G., Nucci, J. A., Arzt, E.

Influence of tantalum and silver interlayers on thermal stress evolution in copper thin films on silicon substrates (2004)

Schmidt,T. K., Balk,T. J., Dehm,G., Arzt,E.

Influence of tantalum and silver interlayers on thermal stress evolution in copper thin films on silicon substrates (2004)

Schmidt, T. K., Balk, T. J., Dehm, G., Arzt, E.

Parallel Glide: A Fundamentally Different Type of Dislocation Motion in Ultrathin Metal Films (2003)

Balk,T. J., Dehm,G., Arzt,E.

Plasticity-Related Phenomena in Metallic Films on Substrates (2003)

Legros,M., Dehm,G., Balk,T. J., Arzt,E., Bostrom,O., Gergaud,P., ...

Parallel glide: Unexpected dislocation motion parallel to the substrate in ultrathin copper films (2003)

Balk,T. J., Dehm,G., Arzt,E.

Mechanical size-effects and dislocation dynamics in Cu thin films (2003)

Dehm,G., Edongue,H., Balk,T. J., Arzt,E.

Small-scale plasticity in thin Cu and Al films (2003)

Dehm,G., Balk,T. J., Edongue,H., Arzt,E.

Parallel Glide: A Fundamentally Different Type of Dislocation Motion in Ultrathin Metal Films (2003)

Balk, T. J., Dehm, G., Arzt, E.

Plasticity-Related Phenomena in Metallic Films on Substrates (2003)

Legros, M., Dehm, G., Balk, T. J., Arzt, E., Bostrom, O., Gergaud, P., ...

Parallel glide: Unexpected dislocation motion parallel to the substrate in ultrathin copper films (2003)

Balk, T. J., Dehm, G., Arzt, E.

Mechanical size-effects and dislocation dynamics in Cu thin films (2003)

Dehm, G., Edongue, H., Balk, T. J., Arzt, E.

Small-scale plasticity in thin Cu and Al films (2003)

Dehm, G., Balk, T. J., Edongue, H., Arzt, E.

Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity (2002)

Dehm,G., Balk,T. J., Von Blanckenhagen,B., Gumbsch,P., Arzt,E.

Plasticity and interfacial dislocation mechanisms in epitaxial and polycrystalline Al films constrained by substrates (2002)

Dehm,G., Wagner,T., Balk,T. J., Arzt,E., Inkson,B. J.

Electromigration-induced damage in bamboo Al interconnects (2002)

Böhm,J., Volkert,C. A., Mönig,R., Balk,T. J., Arzt,E.

New Type of Dislocation Mechanism in Ultrathin Copper Films (2002)

Balk,T. J., Dehm,G., Arzt,E.

Dislocation Mechanisms Controlling Plasticity in Thin Al and Cu Films Constrained by Substrates (2002)

Dehm,G., Balk,T. J., Arzt,E.

Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity (2002)

Dehm, G., Balk, T. J., Von Blanckenhagen, B., Gumbsch, P., Arzt, E.

Plasticity and interfacial dislocation mechanisms in epitaxial and polycrystalline Al films constrained by substrates (2002)

Dehm, G., Wagner, T., Balk, T. J., Arzt, E., Inkson, B. J.

Electromigration-induced damage in bamboo Al interconnects (2002)

Böhm, J., Volkert, C. A., Mönig, R., Balk, T. J., Arzt, E.

New Type of Dislocation Mechanism in Ultrathin Copper Films (2002)

Balk, T. J., Dehm, G., Arzt, E.

Dislocation Mechanisms Controlling Plasticity in Thin Al and Cu Films Constrained by Substrates (2002)

Dehm, G., Balk, T. J., Arzt, E.

Dislocation dynamics in sub-micron confinement: recent progress in Cu thin films plasticity (2002)

Dehm, G., Balk, T.J., Blanckenhagen, B. Von, Gumbsch, P., Arzt, E.

Small is strong - the yield stresses of thin metall23ic films with sub-micron thickness greatly exceed bulk values. While it is clear that this effect must be due to confinement effects on...

Observations of dislocation motion and stress inhomogeneities in a thin copper film (2001)

Balk,T. J., Dehm,G., Arzt,E.

Influence of film/substrate interface structure on plasticity in metal thin films (2001)

Dehm,G., Inkson,B. J., Balk,T. J., Wagner,T., Arzt,E.

Observations of dislocation motion and stress inhomogeneities in a thin copper film (2001)

Balk, T. J., Dehm, G., Arzt, E.

Influence of film/substrate interface structure on plasticity in metal thin films (2001)

Dehm, G., Inkson, B. J., Balk, T. J., Wagner, T., Arzt, E.