PRINCIPLES AND APPLICATIONS OF DEFOCUS-IMAGE MODULATION PROCESSING ELECTRON MICROSCOPY (2008)
Yoshizo Takai, Toshiyuki Ando, Takashi Ikuta, Ryuichi Shimizu, Yoshizo Takai
Principles of defocus-image modulation processing (DIMP) are described from a view point of three-dimensional image formation in transmission electron microscopy (TEM). Two types of defocus-image...
Dynamic Observation of an Atom-Sized Gold Wire by Phase Electron Microscopy (2001)
Ikuta, Takashi, Kawasaki, Tadahiro, Kimura, Yoshihide, Shimizu, Ryuichi, Takai, Yoshizo
Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum (2001)
Kawasaki, Tadahiro, Takai, Yoshizo, Ikuta, Takashi, Shimizu, Ryuichi
A method to obtain a nano‐area electron diffraction pattern in transmission electron microscopy (TEM) was proposed, based on three‐dimensional (3D) image formation theory. This method...
In imaging systems, especially in a high-resolution transmission electron microscope, residual aberrations of objective lenses, such as a spherical aberration or coma aberration, degrade the quality...
Kimura, Yoshihide, Takai, Yoshizo, Kawasaki, Tasahiro, Shimizu, Ryuichi, Ikuta, Takashi, Isakozawa, Shigeto, ...
A real-time ‘defocus image modulation processing electron microscope’ (DIMP-EM) has been developed by the ‘Research for the Future Program’ which was started in 1996 by the Japan Society for...
Takai, Yoshizo, Kimura, Yoshihide, Ikuta, Takashi, Shimizu, Ryuichi, Sato, Yuji, Isakozawa, Shigehito, ...
A real-time defocus-image modulation processing lectron microscope, which utilizes a custom designed, floating type, accelerating voltage generation system to modulate focus quickly and precisely,...
Optimization of voltage axis alignment in high-resolution electron microscopy (1999)
Utsuro, Hidetoshi, Takai, Yoshizo, Ikuta, Takashi, Shimizu, Ryuichi
An improved method for optimizing the voltage axis alignment is proposed. This method is based on averaging of the through-focus images by vibrating the accelerating-voltage rapidly, referred to as...
Yoshizo Takai, Hidetoshi Utsuro, Yoshihide Kimnra, Takashi Ikuta, Ryuichi Shimizu
Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
Takai, Yoshizo, Utsuro, Hidetoshi, Kimura, Yoshihide, Ikuta, Takashi, Shimizu, Ryuichi
Preliminary experimental results for realizing real-time defocus-image modulation processing in a high-resolution transmission electron microscope are reported in terms of equivalence between...
An aberration-free imaging technique based on focal depth extension (1998)
An imaging technique based on focal depth extension in active dynamic hollow cone illumination is proposed and discussed with respect to the influence of the system wave aberration. This imaging...
Ando, Toshiyuki, Taniguchi, Yoshifumi, Takai, Yoshizo, Kimura, Yoshihide, Shimizu, Ryuichi, Ikuta, Takashi
Real-time phase-plateless electron phase microscopy based on active image processing has been developed by utilizing accelerating-voltage modulation. This new method is based on the real-time...
Taniguchi, Yoshifumi, Ikuta, Takashi, Endoh, Hisamitsu, Shimizu, Ryuichi
The defocus-modulation-type active image processing (DMAIP) system for high resolution electron microscopy has been developed. The image shift associated with the change of the defocus value, which...
Image Restoration in Coherent Imaging System Involving Spherical Aberration (1989)
This paper describes an image restoration method based on defocus modulation processing, assuming weakly scattered objects in the coherent imaging system involving spherical aberration. The present...