Ohtani, Ryuichi, Kitamura, Takayuki, Uematsu, Yoshihiko, Hojo, Masaki
The delamination behavior is investigated in static and cyclic creep at elevated temperatures (443 K to 483 K) using double cantilever beam (DCB) specimens of unidirectional carbon fiber reinforced...
Ab initio study of ferroelectricity in edged PbTiO3 nanowires under axial tension (2009)
Shimada, Takahiro, Tomoda, Shogo, Kitamura, Takayuki
The atomistic and electronic structures of PbTiO3 nanowires with characteristic edges consisting of (100) and (010) surfaces and the crucial role of axial tensile strain on ferroelectricity have been...
Ab initio study of stress-induced domain switching in PbTiO3 (2008)
Shimada, Takahiro, Umeno, Yoshitaka, Kitamura, Takayuki
We investigated the atomistic and electronic structure of the 90° domain wall in PbTiO3 and the fundamental mechanism of domain switching induced by shear stress using first-principles density...
Creep crack initiation at a free edge of an interface between submicron thick elements (2008)
Hirakata, Hiroyuki, Hirako, Toshihiro, Takahashi, Yoshimasa, Matsuoka, Yasunori, Kitamura, Takayuki
Quantitative evaluation of plasticity of a ductile nano-component (2008)
Takahashi, Yoshimasa, Hirakata, Hiroyuki, Kitamura, Takayuki
Disappearance of stress singularity at interface edge due to nanostructured thin film (2008)
Sumigawa, Takashi, Hirakata, Hiroyuki, Takemura, Masaki, Matsumoto, Shohel, Suzuki, Motofumi, Kitamura, Takayuki
Anisotropic deformation of thin films comprised of helical nanosprings (2007)
Hirakata, Hiroyuki, Matsumoto, Shohei, Takemura, Masaki, Suzuki, Motofumi, Kitamura, Takayuki
電流と応力による多結晶LSI配線の競合マイグレーション破壊 (2001)
北村, 隆行, 澁谷, 忠弘, 川村, 太, Kitamura, Takayuki, Shibutani, Tadahiro, Kawamura, Futoshi, ...
Electric current induces atom transport in an LSI conductor, which is termed "electromigration (EM)". The EM along grain bondary/interface (GB/IF) often brings about a cavity. Since the EM, flux of...
薄膜界面強度評価法の開発と先進LSI用銅薄膜のはく離への適用 (2000)
北村, 隆行, 澁谷, 忠弘, 上野, 貴司, Kitamura, Takayuki, Shibutani, Tadahiro, Ueno, Takashi, ...
This paper aims to develop a method for evaluating interface strength of thin films on a substrate of LSI chip. Although several methods have been proposed, plastic deformation and fracture of thin...
LSI配線のストレスマイグレーション破壊に及ぼす粒界/界面ネットワークの影響 (1999)
澁谷, 忠弘, 北村, 隆行, 大谷, 隆一, Shibutani, Tadahiro, Kitamura, Takayuki, Ohtani, Ryuichi, ...
Atom migration induced stress in an LSI conductor is analyzed on the basis of diffusion along grain boundary (GB) and interface. The focus is put on the network of GB and interface, which strongly...
体拡散クリープ下の粒界キャビティ成長の数値解析 (1998)
北村, 隆行, 澁谷, 忠弘, 大谷, 隆一, Kitamura, Takayuki, Shibutani, Tadahiro, Ohtani, Ryuichi, ...
To date, analytical study has not been conducted on the growth of grain boundary cavity under lattice diffusion creep, though the growth behavior has been intensely analyzed for grain boundary...
Kitamura, Takayuki, Uematsu, Yoshihiko, Ohtani, Ryuichi
The behavior of Mode I delamination crack propagation of a undirectional CF/PEEK composite was investigated in fatigue at 473K (200 C). The crack propagation was classified into two types:...
Kitamura, Takayuki, Tanaka, Naohiko, Watanabe, Junichi, Kanegasaki, Shiro, Yamada, Yoshitsugu, ...
Idiopathic pulmonary alveolar proteinosis (I-PAP) is a rare disease of unknown etiology in which the alveoli fill with lipoproteinaceous material. We report here that I-PAP is an autoimmune disease...