Rende, D., Schwarz, K., Rabe, U., Maier, W.F., Arnold, W.
Piezoelectric materials are used in an ever increasing number of technical products. The need for new and improved piezoelectric materials is growing rapidly. Conventional methods are too slow to...
Kopycinska-Müller, M., Caron, A., Hirsekorn, M., Rabe, U., Natter, H., Hempelmann, R., ...
Atomic force acoustic microscopy (AFAM) is a near-field technique, where the vibration behavior of a micro-fabricated elastic cantilever beam in contact with a sample surfaceis sensitive to its local...
Hirsekorn, S., Rabe, U., Bruche, D., Maurer, J., Arnold, W., Grov, N., ...
In automotive engineering die-casting components from non-ferrous metals are increasingly used as safety parts, which to a 100% have to be tested non-destructively. Additionally, for cost-efficient...
Excitation of atomic force microscope cantilever vibrations by a Schottky barrier (2008)
Schwarz, K., Rabe, U., Hirsekorn, S., Arnold, W.
We have developed a method to excite cantilever vibrations for dynamic force microscopy. A n-doped silicon cantilever is coated by platinum. At the interface, a Schottky barrier forms whose depletion...
Kumar, A., Rabe, U., Hirsekorn, S., Arnold, W.
We determined the isotropic indentation modulus of precipitates in cubic materials by using the indentation modulus of the matrix as a reference. This eliminates major practical difficulty of...
Excitation of atomic force microscope cantilever vibrations by a Schottky barrier (2008)
Schwarz, K., Rabe, U., Hirsekorn, S., Arnold, W.
We have developed a method to excite cantilever vibrations for dynamic force microscopy. A n-doped silicon cantilever is coated by platinum. At the interface, a Schottky barrier forms whose depletion...
Kumar, A., Rabe, U., Hirsekorn, S., Arnold, W.
We determined the isotropic indentation modulus of precipitates in cubic materials by using the indentation modulus of the matrix as a reference. This eliminates major practical difficulty of...
Elastic properties of clay minerals determined by atomic force acoustic microscopy technique (2007)
Kopycinska-Müller, M., Prasad, M., Rabe, U., Arnold, W.
Seismic wave propagation in geological formations is altered by the presence of clay minerals. Knowledge about the elastic properties of clay is therefore essential for the interpretation and...
Caron, A., Rabe, U., Rödel, J., Arnold, W.
Scanning probe microscopy techniques enable one to investigate surface properties such as contact stiffness and friction between the probe tip and a sample with nm resolution. So far the bending and...
Finite-element simulation of cantilever vibrations in atomic force acoustic microscopy (2007)
Espinoza Beltrán, F.J., Scholz, T., Schneider, G.A., Munoz Saldana, J., Rabe, U., Arnold, W.
Atomic Force Acoustic Microscopy has been proven to be a powerful technique for materials characterization with nanoscale lateral resolution. This technique allows one to obtain images of elastic...
Finite-element simulation of cantilever vibrations in atomic force acoustic microscopy (2007)
Espinoza Beltrán, F.J., Scholz, T., Schneider, G.A., Munoz Saldana, J., Rabe, U., Arnold, W.
Atomic Force Acoustic Microscopy has been proven to be a powerful technique for materials characterization with nanoscale lateral resolution. This technique allows one to obtain images of elastic...
Arnold, W., Schwarz, K., Rabe, U.
DE 102005038245 A1 UPAB: 20070529 NOVELTY - The device has a semiconductor material which does not have any piezoelectric properties. A tip (3) which can be brought into contact with the sample...
Influence of the cantilever holder on the vibrations of AFM cantilevers (2007)
Rabe, U., Hirsekorn, S., Reinstädtler, M., Sulzbach, T., Lehrer, C., Arnold, W.
Dynamic techniques exploiting the vibration of atomic force microscope (AFM) cantilevers are often superior to quasi-static operation, in particular with respect to the signal-to-noise ratio. Tapping...
Porositätsprüfung von NE-Metall-Druckguss durch Hochfrequenzultraschall (2007)
Hirsekorn, S., Rabe, U., Bruche, D., Grov, N., Kinzler, T., Arnold, W.
Ein großer Teil der Druckgusserzeugnisse aus Nichteisenmetallen, wie z. B. aus Aluminium-, Kupfer-, Magnesium- und Zinkbasislegierungen, wird im Automobilbau eingesetzt. Immer mehr dieser...
Rende, D., Schwarz, K., Rabe, U., Maier, W.F., Arnold, W.
The development of an automated production of thin films and the characterization of their piezoelectric properties in high-throughput are described. A library of 50 undoped as well as doped lead...
High-frequency ultrasonic porosity testing of non-ferrous metal die-casting components (2007)
Hirsekorn, S., Rabe, U., Bruche, D., Arnold, W., Grov, N., Kinzler, T.
With the described measurements and theoretical estimations we have shown that ultrasonic backscattering is well suited to detect porosity and single pores in the near-surface range (0.5 to 2 mm...
Nonlinear contact resonance spectroscopy in atomic force microscopy (2007)
Rupp, D., Rabe, U., Hirsekorn, S., Arnold, W.
There are several techniques which combine atomic force microscopy with ultrasonics. In atomic force acoustic microscopy the cantilever is forced to ultrasonic vibrations while the tip is in contact...
Rabe, U., Arnold, W., Caron, A., Hirsekorn, S., Schwarz, K.
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe echniques to ultrasonics. Atomic force acoustic microscopy (AFAM) and lateral...
Hirsekorn, S., Rabe, U., Arnold, W.
The research work on Nonlinear Elastic Wave Spectroscopy (NEWS) of this contribution is focused on nonlinear ultrasonic transmission through damaged composite laminates for quality assessment. The...
Atomic force acoustic microscopy (2006)
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one wavelength of the involved radiation, here the acoustic wave. Using near-field microscopes the...
Determination of deformation fields by atomic force acoustic microscopy (2006)
Bendjus, B., Köhler, B., Heuer, H., Rabe, U., Striegler, A.
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound. Atomic Force Acoustic Microscopy (AFAM) and Ultrasonic Force Microscopy (UFM) become increasingly...
Investigating ultra-thin lubricant layers using resonant friction force microscopy (2005)
Reinstädtler, M., Rabe, U., Goldade, A., Bhushan, B., Arnold, W.
The ultrasonic friction mode of an atomic force microscope is a scanning probe technique allowing one to analyze the load and velocity dependence of friction. The technique is based on evaluation of...
Atomic force microscopy at ultrasonic frequencies (2005)
Arnold, W., Caron, A., Hirsekorn, S., Kopycinska-Müller, M., Rabe, U., Reinstädtler, M.
The AFAM and ultrasonic piezo-mode techniques described here lend itself for studying materials properties in ceramics on a nanoscale. Whereas the various imaging modes become more and more routine,...
Imaging and measurement of elasticity and friction using the TRmode (2005)
Reinstädtler, M., Kasai, T., Rabe, U., Bhushan, B., Arnold, W.
Torsional and lateral vibrations of atomic force microscope (AFM) cantilevers can be used to measure elastic and frictional properties on a nanoscale. Recently a new dynamic operation mode called...
Imaging using lateral bending modes of atomic force microscope cantilevers (2004)
Caron, A., Rabe, U., Reinstadtler, M., Turner, Joseph A., Arnold, W.
Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force...
Caron, A., Rabe, U., Arnold, W.
Die genaue Kenntnis der mechanischen Eigenschaften von Werkstoffen ist für ihren Einsatz unentbehrlich. Mit der Entwicklung nanoskaliger Werkstoffe wächst das Bedürfnis nach Prüfverfahren, deren...
Ultrasonic modes in atomic force microscopy (2004)
Kopycinska-Müller, M., Reinstädtler, M., Rabe, U., Caron, A., Hirsekorn, S., Arnold, W.
Atomic Force Acoustic Microscopy (AFAM) and Lateral Atomic Force Acoustic Microscopy (LAFAM) are dynamic enhancements of the Atomic Force Microscope (AFM). They combine the high lateral resolution of...
Arnold, W., Hirsekorn, S., Kopycinska-Müller, M., Reinstädtler, M., Rabe, U.
In Atomic Force Acoustic Microscopy (AFAM) the cantilever is vibrating in one of its resonance frequencies while the sensor tip remains in contact with the sample surface. The elastic constant which...
Imaging using lateral bending modes of atomic force microscope cantilevers (2004)
Caron, A., Rabe, U., Reinstädtler, M., Turner, J., Arnold, W.
Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force...
Reinstaedtler, M., Rabe, U., Arnold, W.
WO2004018963 A UPAB: 20040405 NOVELTY - The method uses a scanning microscope using a flexure beam (1) provided with a measuring tip (2) precisely positioned relative to a sample surface (3) via a...
Kopycinska-Müller, M., Rabe, U., Hirsekorn, S., Ziebert, C., Schmitt, H., Arnold, W.
Atomic Force Acoustic Microscope and ultrasonic piezo-mode have been applied in order to investigate the influence of the local polarization on the elastic and the piezoelectric properties of...
Kopycinska, M., Ziebert, C., Schmitt, H., Rabe, U., Hirsekorn, S., Arnold, W.
In this study the influence of the annealing conditions on the surface morphology and the elastic and piezoelectric properties of thin-film lead calcium titanate samples were investigated with...
Reinstädtler, M., Rabe, U., Scherer, V., Turner, J., Arnold, W.
Commercial rectangular atomic force microscope cantilever beams made of silicon were set into vibration, using a piezoelectric ultrasonic transducer coupled to the chip of a cantilever. The...
Reinstaedtler, M., Rabe, U., Scherer, V., Hartmann, U., Goldade, A., Bhushan, B., ...
We studied friction and stick-slip phenomena on bare and lubricated silicon samples by measuring the torsional contact resonances of atomic force microscope cantilevers. A piezoelectric transducer...
Hirsekorn, S., Kopycinska-Müller, M., Rabe, U., Reinstädtler, M., Caron, A., Arnold, W.
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a sensor tip are used to generate high-resolution images of sample surfaces. In dynamic modes, the...
Cyclic cluster growth in ferroelectric perovskites (2002)
We prove that point defect clustering in perovskite ferroelectrics and the subsequent loss in switchable polarization can occur only if the depolarizing fields are locally unscreened during certain...
Rabe, U., Kopycinska, M., Hirsekorn, S., Munoz Saldana, J., Schneider, G., Arnold, W.
The local elastic properties and the ferroelectric domain configuration of piezoelectric ceramics have been examined by atomic force acoustic microscopy and by ultrasonic piezoelectric force...
Imaging of the ferroelectric domains pattern in the ultrasonic piezo-mode (2002)
Kopycinska, M., Rabe, U., Hirsekorn, S., Arnold, W.
The Atomic Force Acoustic Microscope technique (AFAM) has been applied in order to investigate the elastic properties of different types of materials. With this technique it is possible to resolve...
Rabe, U., Kopycinska, M., Hirsekorn, S., Arnold, W.
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe techniques in the nanometer range to ultrasonics. One possible method is to...
Atomic force microscopy at ultrasonic frequencies (2002)
Arnold, W., Hirsekorn, S., Kopycinska, M., Rabe, U., Reinstädtler, M., Scherer, V.
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surface or tip is scanned, belong to the standard features of most commercial instruments. With these...
Rabe, U., Amelio, S., Kopycinska, M., Hirsekorn, S., Kempf, M., Göken, M., ...
In atomic force acoustic microscopy (AFAM) the cantilever of an atomic force microscope (AFM) is vibrated at ultrasonic frequencies while a sample surface is scanned with the sensor tip contacting...
New Perspectives of Microtribology - Methods and Applications (2002)
Reinstädtler, M., Scherer, V., Kullenberg, E., Rabe, U., Arnold, W.
We have developed a strategy to investigate thin film lubricants commonly used for computer hard disks employing Friction Force Microscopy (FFM). Polyflouropolyether (PFPE) lubricant films of...
Ultrasonic radiation in dynamic force microscopy (2001)
Hirsekorn, S., Rabe, U., Arnold, W.
In dynamic force microscopy the cantilever of an atomic force microscope is vibrated at ultrasonic frequencies in the range of several 10 kHz up to several MHz while scanning a sample surface....
Atomic Force Microscopy at Ultrasonic Frequencies (2001)
Arnold, W., Hirsekorn, S., Kopycinska, M., Rabe, U.
In Atomic Force Microscopy (AFM) deflection of a microfabricated elastic beam with a sensor tip at its end is used to generate high-resolution images of surfaces. Dynamic modes, where the cantilever...
Amelio, S., Goldade, A., Rabe, U., Scherer, V., Bhushan, B., Arnold, W.
We present a comparative study of the elastic stiffness of ultra-thin (5,20 and 100 nm thick) diamond-like carbon coatings with a sampling depth less than or comparable to the thickness of the...
Hochauflösende Abbildung von Oberflächensteifigkeiten mittels Ultraschall-Kraftmikroskopie (2001)
Rabe, U., Amelio, S., Hirsekorn, S., Arnold, W.
Unter Ultraschall-Kraftmikroskopie (AFAM für "Atomic Force Acoustic Microscopy") versteht man Techniken, bei denen Ultraschallwellen in der Probe und in der mikroskopischen Blattfeder des...
Hochauflösende Abbildung von Oberflächensteifigkeiten mittels Ultraschall-Kraftmikroskopie (2001)
Rabe, U., Amelio, S., Hirsekorn, S., Arnold, W.
Unter Ultraschall-Kraftmikroskopie (AFAM für "Atomic Force Acoustic Microscopy") versteht man Techniken, bei denen Ultraschallwellen in der Probe und in der mikroskopischen Blattfeder des...
Quantitative contact spectroscopy by atomic-force acoustic microscopy (2000)
Rabe, U., Kester, E., Scherer, V., Arnold, W.
In Atomic Force Microscopy (AFM) deflection of a microfabricated elastic beam with a sensor tip at its end is used to generate high-resolution images of surfaces. Dynamic modes, where the cantilever...
Imaging of ferroelectric domains by atomic force aoustic microscopy (2000)
Rabe, U., Amelio, S., Hirsekorn, S., Arnold, W.
Atomic Force Microscopy (AFM) is a near-field technique to generate high-resolution images of surfaces. A microfabricated elastic beam with an integrated sharp sensor tip at its end is scanned over...
Quantitative contact spectroscopy by atomic force acoustic microscopy (2000)
Amelio, S., Rabe, U., Kester, E., Hirsekorn, S., Arnold, W.
The evaluation of the cantilever vibration spectra at ultrasonic frequencies in an AFM is presented in order to descern local elastic data quantitatively. In imaging, our technique allows e. g. to...
Arnold, W., Amelio, S., Hirsekorn, S., Kopycinska, M., Rabe, U.
In Atomic Force Microscopy (AFM) deflection of a micro-fabricated elastic beam with a sensor tip at ist end is used to generate high-resolution images of surfaces. Dynamic modes, where the cantilever...
Nondestructive Characterization of PZT Materials for Sensor and Actuator Applications (2000)
Scherer, V., Hirsekorn, S., Rabe, U., Arnold, W.
The conventional ultrasonic time-of-flight technique is employed showing that the sound propagation in a poled piezoelectric ceramic is anisotropic. The sound velocity depends on three directions,...
Kester, E., Rabe, U., Presmanes, L., Tailhades, P., Arnold, W.
Using Atomic Force Acoustic Microscopy, the Young's moduli of two thin films of nanocrystalline ferrites with spinel structures have been measured as a function of the oxidation temperature on a...
Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy (2000)
Arnold, W., Amelio, S., Hirsekorn, S., Rabe, U.
Atomic Force Acoustic Microscopy is a near-field technique which combines the ability in using ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes....
Quantitative Determination of Contact Stiffness Using Atomic Force Acoustic Microscopy (2000)
Rabe, U., Amelio, S., Kester, E., Scherer, V., Hirsekorn, S., Arnold, W.
Atomic force acoustic microscopy is a near-field technique which combines the ability of ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We...
Zerstörungsfreie Mikrocharakterisierung multifunktioneller Werkstoffe (1999)
Scherer, V., Hirsekorn, S., Rabe, U., Arnold, W.
Im Rahmen des Schwerpunktprogramms "Wechselbeziehung zwischen elektronischen und mechanischen Eigenschaften keramischer Multifunktionswerkstoffe" der DFG wurden zerstörungsfreie Methoden...
Rabe, U., Arnold, W., Kester, E.
The cantilever-sample system of an atomic force acoustic microscope is excited in the frequency range from 10 kHz to e MHz. By analysing the cantilever vibration in the frequency domain, one obtains...
On the Contrast in Eddy Current Microscopy using Atomic Force Microscopes (1999)
Hirsekorn, S., Rabe, U., Boub, A., Arnold, W.
A magnetic probe of an atomic force microscope oscillating above a sample induces eddy currents within conducting materials. The resulting electrodynamic interaction between sample and probe...
Kester, E., Rabe, U., Arnold, W., Presmanes, L., Tailhades, P.
To measure local elasticity by atomic Force Acoustic Microscopy (AFAM), the sample placed in a commerical AFM is insonified by ultrasonic waves or the cantilever is oscillated at ultrasonic...
Analysis of the High-Frequency Response of Atomic Force Microscope Cantilevers (1998)
Rabe, U., Arnold, W., Turner, J.
In most commercial atomic force microscopes, dynamic modes are now available as standard operation modes. Acoustical vibrations of atomic force microscope cantilevers can be excited eihter by...
Through the use of an acoustic microscope, it is possible to measure the topography of a sample (11) and at the same time its elasticity characteristics. The deflection of a dial indicator (1) is...
Arnold, W., Fassbender, S., Janser, K., Rabe, U., Scherer, V.
Hochleistungskeramiken finden aufgrund ihrer Temperaturbeständigkeit und ihrer chemischen Beständigkeit breite Einsatzgebiete. Allerdings tritt wegen der niedrigen Bruchzähigkeit K(IC)...
Nanomechanical Surface Characterization by Atomic Force Acoustic Microscopy (1997)
Arnold, W., Hirsekorn, S., Rabe, U., Scherer, V.
We constructed an atomic force acoustic microscope that enables one to detect out-of-plane and in-plane sample surface vibrations in a wide frequency range from about 100 kHz to several MHz. From the...
Microscopic methods for micro materials characterization (1997)
Hirsekorn, S., Rabe, U., Fassbender, S., Scherer, V., Arnold, W.
Meissner, O., Arnold, W., Janser, K., Rabe, U., Scherer, V.
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography of various surfaces with corrugations down to the atomic scale. Since then, development of new...