U. Staufer

Publication List Details

Period

1996 - 2009

Number

131

Co-Authors

Collection of transverse and longitudinal fields by means of apertureless nanoprobes with different metal coating characteristics (2007)

Descrovi, E., Vaccaro, L., Nakagawa, Wataru, Aeschimann, L., Staufer, U., Herzig, Hans-Peter

The coupling and transmission of transverse and longitudinal fields into apertureless microfabricated near-field optical probes is investigated. Two kinds of probes with different metal coating...

Propagation of the electromagnetic field in fully coated near-field optical probes (2007)

Vaccaro, L., Aeschimann, L., Staufer, U., Herzig, Hans-Peter, Dändliker, René

Fully metal-coated near-field optical probes, based on a cantilever design, have been studied theoretically and experimentally. Numerical simulations prove that these structures allow nonzero modal...

Collection of transverse and longitudinal fields by means of apertureless nanoprobes with different metal coating characteristics (2007)

Descrovi, E., Vaccaro, L., Nakagawa, Wataru, Aeschimann, L., Staufer, U., Herzig, Hans-Peter

The coupling and transmission of transverse and longitudinal fields into apertureless microfabricated near-field optical probes is investigated. Two kinds of probes with different metal coating...

Propagation of the electromagnetic field in fully coated near-field optical probes (2007)

Vaccaro, L., Aeschimann, L., Staufer, U., Herzig, Hans-Peter, Dändliker, René

Fully metal-coated near-field optical probes, based on a cantilever design, have been studied theoretically and experimentally. Numerical simulations prove that these structures allow nonzero modal...

Concept and demonstration of individual probe actuation in two-dimensional parallel atomic force microscope system (2007)

Akiyama, T., Aeschimann, L., Chantada, L., De Rooij, N. F., Heinzelmann, H., Herzig, H. P., ...

A concept of an array actuator that is used to control the tip-sample separation of cantilevers in a two-dimensional (2D) probe array scanning system is proposed in this article. The feasibility of...

Electron beam lithography with negative Calixarene resists on dense materials: Taking advantage of proximity effects to increase pattern density (2005)

Buhlmann, S., Muralt, P., Kuenzi, P. A., Staufer, U.

A high-resolution negative Calixarene resist has been used to pattern 2-nm-thick TiO2 films on 50-nm-thick Pt layers by electron beam lithography, in order to carry out site controlled growth of...

Optical properties of microfabricated fully-metal-coated near-field probes in collection mode (2005)

Descrovi, E., Vaccaro, L., Aeschimann, L., Nakagawa, W., Staufer, U., Herzig, H. P.

A study of the optical properties of microfabricated, fully-metal-coated quartz probes collecting longitudinal and transverse optical fields is presented. The measurements are performed by raster...

Collection of transverse and longitudinal fields by means of apertureless nanoprobes with different metal coating characteristics (2004)

Descrovi, E., Vaccaro, L., Nakagawa, W., Aeschlimann, L., Staufer, U., Herzig, H. P.

The coupling and transmission of transverse and longitudinal fields into apertureless microfabricated near-field optical probes is investigated. Two kinds of probes with different metal coating...

Characterization of photonic crystal waveguides based on Fabry-Pérot interference (2004)

Märki, I., Salt, G., Stanley, R., Staufer, U., Herzig, H. P.

We present two methods based on the analysis of Fabry-Pérot interference for a detailed characterization of a 90° corner in a two-dimensional photonic crystal waveguide fabricated in a thin Si...

Propagation of the electromagnetic field in fully coated near-field optical probes (2003)

Vaccaro, L., Aeschimann, L., Staufer, U., Herzig, H. P., Dändliker, R.

The propagation of the electromagnetic field in fully coated near field optical probes was analyzed. It was proved that these structures allow nonzero modal emission of the electromagnetic field...

Multiple Andreev reflection and giant excess noise in diffusive superconductor/normal-metal/superconductor junctions (2000)

Hoss, Tilman, Strunk, Christoph, Nussbaumer, Thomas, Huber, R., Staufer, U., Schonenberger, Christian

We have studied superconductor/normal-metal/superconductor (SNS) junctions consisting of shea Au or Cu wires between Nh or Al banks. The Nb based junctions display inherent electron heating effects...

Multiple Andreev Reflection and Giant Excess Noise in Diffusive Superconductor/Normal-Metal/Superconductor Junctions (1999)

Hoss, T., Strunk, C., Nussbaumer, T., Huber, R., Staufer, U., Schonenberger, C.

We have studied superconductor/normal metal/superconductor (SNS) junctions consisting of short Au or Cu wires between Nb or Al banks. The Nb based junctions display inherent electron heating effects...

Characterization of an integrated force sensor based on a MOS transistor for applications in scanning force microscopy (1998)

Akiyama, T, Tonin, A, Hidber, H R, Brugger, J, Vettiger, P, Staufer, U, ...

In this article an integrated force sensor based on a stress-sensing MOS transistor is introduced for applications in scanning force microscopy (SFM) . The sensor configuration will be described, and...

Secondary Electron Imaging by Means of a Microfabricated Electron Column (1996)

Stebler, C., Despont, M., Staufer, U.

This letter reports about the application of a miniaturized electron microscope for generating scanning secondary-electron images. The employed electrostatic lens-system was fabricated using silicon...

Secondary Electron Imaging by Means of a Microfabricated Electron Column (1996)

Stebler, C., Despont, M., Staufer, U.

This letter reports about the application of a miniaturized electron microscope for generating scanning secondary-electron images. The employed electrostatic lens-system was fabricated using silicon...

Secondary Electron Imaging by Means of a Microfabricated Electron Column (1996)

Stebler, C., Despont, M., Staufer, U.

This letter reports about the application of a miniaturized electron microscope for generating scanning secondary-electron images. The employed electrostatic lens-system was fabricated using silicon...