W. T. Elam

Deconvolving Instrumental and Intrinsic Broadening in Excited State X-ray Spectroscopies (2007)

Fister, T. T., Seidler, G. T., Rehr, J. J., Kas, J. J., Elam, W. T., Cross, J. O., ...

Intrinsic and experimental mechanisms frequently lead to broadening of spectral features in excited-state spectroscopies. For example, intrinsic broadening occurs in x-ray absorption spectroscopy...

Report on the Use of X-Ray Fluorescence as a Trace Metal Sensor for the Cone Penetrometer (2006)

Elam, W. T., Gilfrich, J. V.

This report addresses two sets of issues concerning the use of x-ray fluorescence as a sensor technology for the cone penetrometer. The first group concerns the applicability of XRF to this...

Site Characterization and Analysis Penetrometer System (SCAPS) Heavy Metal Sensors Demonstration/Validation. Technology Demonstration Report (with) Fiber-Optic LIBS (FO-LIBS) and XRF Data (and) Downhole-Laser LIBS (DL-LIBS) and Data Summary (CD-ROM) (2002)

Lieberman, S. H., Boss, P. A., Cortes, J., Elam, W. T.

ELECTRONIC FILE CHARACTERISTICS: 1,393 data and text files; MS Word (.DOC), Excel (.XLS), and PowerPoint (.PPT). PHYSICAL DESCRIPTION: 2 computer laser optical discs (CD-ROM); 4 3/4 in. ea.; 769 MB....

Extended Fine Structure Above Vanadium L-Shell Appearance Potential Thresholds, (2002)

Cohen,P. I., Einstein,T. L., Elam,W. T., Fukuda,Y., Park,Robert L.

The probability of electron scattering from atomic core states as a function of electron energy, can be extracted from secondary electron yields by differentiation. Fine structure variations above...

Nearest Neighbor Spacings of Clean Vanadium Surfaces from Extended Appearance Potential Fine Structure, (2002)

Elam,W. T., Cohen,P. I., Roelofs,L., Park,Robert L.

Fine structure in the excitation probability of the 2p core state of vanadium by electron bombardment has been found to extend for several hundred volts above the appearance potential threshold. The...

Extended Appearance Potential Fine Structure Analysis: Oxygen on Aluminum (100), (2002)

DENBoer,M. L., Einstein,T. L., Elam,W. T., Park,Robert L., Roelofs,L. D.

To measure oxygen-aluminum separation at Al (100) surfaces disordered (LEED beams extinguished) by reaction with oxygen, we analyzed the extended appearance potential fine structure above the...

X-Ray Fluorescence Analysis at the Naval Research Laboratory (1998)

Gilfrich, John V., Elam, W. T.

This essay outlines the significant work of one group at the Naval Research Laboratory (NRL) during 50 years of leadership in X-ray Fluorescence Analysis (XRF). NRL has produced many of the...

Field Demonstration of tbe SCAPS XRF Metals Sensor. (1998)

Elam, W. T., Adams, Jane, Hudson, Karrol R., McDonald, Blair, Eng, Dan

The SCAPS XRF Metals Sensor adds metals detection capability to the DOD Site Characterization Penetrometer System (SCAPS). It works using X-ray Fluorescence (XRF) to detect-all metals above calcium...

Direct observation of Crmagnetic order in CoCrTa and CoCrPt thin films (1997)

Kemner, K.M., Idzerda, Y.U., Harris, V.G., Chakarian, C., Elam, W.T., Kao, C.C., ...

Preferential site distribution of dilute Pt and Ta in CoCr-based films: An extended x-ray absorption fine structure study (1997)

Kemner, K.M., Harris, V.G., Elam, W.T., Feng, Y.C., Laughlin, D.E., Woicik, J.C., ...

Polarization dependent EXAFS studies of chemical and structural anisotropy in sputter deposited Co78Cr22 films (1994)

Kemner, K.M., Harris, V.G., Elam, W.T., Lodder, J.C.