ACCELERATED TESTING TECHNOLOGY (2006)
Yurkowsky, W., Schafer, R. E., Finkelstein, J. M.
The report, in two volumes, is devoted to an investigation into the state-of-the-art of methods for reducing the time and expense associated with life testing, particularly as it relates to parts....
ACCELERATED TESTING TECHNOLOGY. VOLUME II. HANDBOOK OF ACCELERATED LIFE TESTING METHODS (2006)
Yurkowsky, W., Schafer, R. E., Finkelstein, J. M.
The report, in two volumes, is devoted to an investigation into the state-of-the-art of methods for reducing the time and expense associated with life testing, particularly as it relates to parts....
ACCELERATED RELIABILITY TESTING FOR NONELECTRONIC PARTS. (2005)
This study was conducted to develop techniques to reduce test time, sample size and cost involved in the demonstration of the reliability of long lived nonelectronic parts. It was also the purpose of...