W. Zahorowski

Publication List Details

Period

1987 - 1990

Number

7

Co-Authors

X-ray Emission and Absorption Studies of Silicides in Relation to their Electronic Structure (1990)

Weijs, P.J.W., Wiech, G., Zahorowski, W., Speier, W., Goedkoop, J.B., Czyżyk, M., ...

The valence bands and conduction bands of about 30 transition metal silicides (of which we concentrate on 4 here) have been investigated by measurements of Si X-ray emission bandsspectra, X-ray...

BONDS IN AMORPHOUS Nb1-xSix STUDIED BY X-RAY EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPY (1987)

Zahorowski, W., Simunek, A., Wiech, G., SÖldner, K., Knauf, R ., Ischenko, Saemann

X-ray emission bands (Si K, Si L, Nb Lβ2) and XPS spectra of amorphous a-Nb1-xSix (x=0.20, 0.80), cryst. silicon, a-Si and NbSi2 were combined to identify the origin of al1 their spectral...

DEPTH DISTRIBUTION OF CHARACTERISTIC X-RAYS OF NICKEL AND COPPER EXCITED BY ELECTRON BOMBARDMENT (1987)

Wiech, G., Zahorowski, W.

The peak intensity of the Ni Lα and the Cu Kα lines excited by electron bombardment was measured as a function of the thickness of the target and at different incident electron energies....

BONDS IN AMORPHOUS Nb1-xSix STUDIED BY X-RAY EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPY (1987)

Zahorowski, W., Simunek, A., Wiech, G., SÖldner, K., Knauf, R ., Ischenko, Saemann

X-ray emission bands (Si K, Si L, Nb Lβ2) and XPS spectra of amorphous a-Nb1-xSix (x=0.20, 0.80), cryst. silicon, a-Si and NbSi2 were combined to identify the origin of al1 their spectral...

DEPTH DISTRIBUTION OF CHARACTERISTIC X-RAYS OF NICKEL AND COPPER EXCITED BY ELECTRON BOMBARDMENT (1987)

Wiech, G., Zahorowski, W.

The peak intensity of the Ni Lα and the Cu Kα lines excited by electron bombardment was measured as a function of the thickness of the target and at different incident electron energies....

BONDS IN AMORPHOUS Nb1-xSix STUDIED BY X-RAY EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPY (1987)

Zahorowski, W., Simunek, A., Wiech, G., SÖldner, K., Knauf, R ., Ischenko, Saemann

X-ray emission bands (Si K, Si L, Nb Lβ2) and XPS spectra of amorphous a-Nb1-xSix (x=0.20, 0.80), cryst. silicon, a-Si and NbSi2 were combined to identify the origin of al1 their spectral...

DEPTH DISTRIBUTION OF CHARACTERISTIC X-RAYS OF NICKEL AND COPPER EXCITED BY ELECTRON BOMBARDMENT (1987)

Wiech, G., Zahorowski, W.

The peak intensity of the Ni Lα and the Cu Kα lines excited by electron bombardment was measured as a function of the thickness of the target and at different incident electron energies....