Exciton doublet in the Mott-Hubbard LiCuVO$_4$ insulator identified by spectral ellipsometry (2009)
Matiks, Y., Horsch, P., Kremer, R. K., Keimer, B., Boris, A. V.
Spectroscopic ellipsometry was used to study the dielectric function of LiCuVO$_{4}$, a compound comprised of chains of edge-sharing CuO$_4$ plaquettes, in the spectral range (0.75 - 6.5) eV at...
Signatures of Electronic Correlations in Optical Properties of LaFeAsO$_{1-x}$F$_x$ (2008)
Boris, A. V., Kovaleva, N. N., Seo, S. S. A., Kim, J. S., Popovich, P., Matiks, Y., ...
Spectroscopic ellipsometry is used to determine the dielectric function of the superconducting LaFeAsO$_{0.9}$F$_{0.1}$ ($T_c$ = 27 K) and undoped LaFeAsO polycrystalline samples in the wide range...