Nishinaka, Kenichi, Taka, Shinsuke, Kimura, Yoshihide, Takai, Yoshizo
We have developed a new analytical transmission electron microscope (TEM), called coincidence TEM, which, in principle, enables observation of elemental mapping images at a high signal-to-noise...
Nomaguchi, Tsunenori, Kawasaki, Tadahiro, Kimura, Yoshihide, Takai, Yoshizo
Linear and non-linear image components in high-resolution transmission electron microscope images were successfully separated by applying a bandpass filter to the three-dimensional Fourier spectrum...
Dynamic Observation of an Atom-Sized Gold Wire by Phase Electron Microscopy (2001)
Ikuta, Takashi, Kawasaki, Tadahiro, Kimura, Yoshihide, Shimizu, Ryuichi, Takai, Yoshizo
Fourier analysis of HRTEM image deterioration caused by mechanical vibration (2001)
Kawasaki, Tadahiro, Kimura, Yoshihide, Takai, Yoshizo, Shimizu, Ryuichi
Contrast deterioration of high‐resolution transmission electron microscope (HRTEM) images, that is caused by mechanical vibrations of the turbo molecular pump (TMP), was systematically and...
Nanoprobe cathodoluminescence scanning electron microscope as applied to synthesized diamond (1999)
Matsuo, Hiroshi, Awata, Shogo, Kimura, Yoshihide, Shimizu, Ryuichi
A specific cold stage and programmable photon counting system was developed for the nanoprobe cathodoluminescence scanning electron microscope (CLSEM) to characterize synthesized diamonds. This...
Kimura, Yoshihide, Takai, Yoshizo, Kawasaki, Tasahiro, Shimizu, Ryuichi, Ikuta, Takashi, Isakozawa, Shigeto, ...
A real-time ‘defocus image modulation processing electron microscope’ (DIMP-EM) has been developed by the ‘Research for the Future Program’ which was started in 1996 by the Japan Society for...
Takai, Yoshizo, Kimura, Yoshihide, Ikuta, Takashi, Shimizu, Ryuichi, Sato, Yuji, Isakozawa, Shigehito, ...
A real-time defocus-image modulation processing lectron microscope, which utilizes a custom designed, floating type, accelerating voltage generation system to modulate focus quickly and precisely,...
Takai, Yoshizo, Utsuro, Hidetoshi, Kimura, Yoshihide, Ikuta, Takashi, Shimizu, Ryuichi
Preliminary experimental results for realizing real-time defocus-image modulation processing in a high-resolution transmission electron microscope are reported in terms of equivalence between...
Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM (1998)
Akita, Tomoki, Nagata, Takanori, Kimura, Yoshihide, Takai, Yoshizo, Shimizu, Ryuichi
Clean surfaces of aluminum obtained by repeated sputter-cleaning and annealing were observed using UHV-reflection electron microscopy (REM) equipped with an infrared heating apparatus and an in situ...
Yasuno, Motohide, Kimura, Yoshihide, Shimizu, Ryuichi
A coincidence electron microscopic image was successfully observed by using signal electrons that generated characteristic X-rays (Ag L X-rays) during penetration through a specimen (a silver film)....
Development of a Nanoprobe Cathodoluminescence Scanning Electron Microscope (1996)
Matsuo, Hiroshi, Kobayashi, Nobutaka, Kimura, Yoshihide, Shimizu, Ryuichi
A nanoprobe cathodoluminescence (CL) scanning electron microscope was developed, in which a specific optical system consisting of an ellipsoidal mirror, optical light guide, spectrometer and specimen...
Kimura, Yoshihide, Yasuno, Motohide, Shimizu, Ryuichi
An image-construction system for a coincidence transmission electron microscope (coincidence TEM) was developed. The coincidence TEM based on a coincidence measurement technique allows us to select...
Ando, Toshiyuki, Taniguchi, Yoshifumi, Takai, Yoshizo, Kimura, Yoshihide, Shimizu, Ryuichi, Ikuta, Takashi
Real-time phase-plateless electron phase microscopy based on active image processing has been developed by utilizing accelerating-voltage modulation. This new method is based on the real-time...
A New Specimen Holder for UHV-Reflection Electron Microscopy (1994)
Akita, Tomoki, Matsuo, Hiroshi, Kimura, Yoshihide, Shimizu, Ryuichi
A newly designed double-tilting specimen-bolder was constructed for a UHV-reflection electron microscopy (REM). The specimen holder ensures the open space in front of the specimen surface, which...