PRINCIPLES AND APPLICATIONS OF DEFOCUS-IMAGE MODULATION PROCESSING ELECTRON MICROSCOPY (2008)
Yoshizo Takai, Toshiyuki Ando, Takashi Ikuta, Ryuichi Shimizu, Yoshizo Takai
Principles of defocus-image modulation processing (DIMP) are described from a view point of three-dimensional image formation in transmission electron microscopy (TEM). Two types of defocus-image...
Taya, Masaki, Kawasaki, Tadahiro, Takai, Yoshizo
Using a three-dimensional image intensity distribution obtained by spherical aberration-corrected transmission electron microscopy, we studied a cross-sectional image (x-z image) of a gold crystal...
Taya, Masaki, Kawasaki, Tadahiro, Takai, Yoshizo
Using a three-dimensional image intensity distribution obtained by spherical aberration-corrected transmission electron microscopy, we studied a cross-sectional image (x-z image) of a gold crystal...
Taya, Masaki, Kawasaki, Tadahiro, Takai, Yoshizo
Using a three-dimensional image intensity distribution obtained by spherical aberration-corrected transmission electron microscopy, we studied a cross-sectional image (x-z image) of a gold crystal...
Nishinaka, Kenichi, Taka, Shinsuke, Kimura, Yoshihide, Takai, Yoshizo
We have developed a new analytical transmission electron microscope (TEM), called coincidence TEM, which, in principle, enables observation of elemental mapping images at a high signal-to-noise...
Kawasaki, Tadahiro, Taya, Masaki, Takai, Yoshizo
The procedure to determine the appropriate filter shape function used in the three-dimensional Fourier filtering method (3D-FFM) is discussed from a practical point of view, so as to reduce the...
Nomaguchi, Tsunenori, Kawasaki, Tadahiro, Kimura, Yoshihide, Takai, Yoshizo
Linear and non-linear image components in high-resolution transmission electron microscope images were successfully separated by applying a bandpass filter to the three-dimensional Fourier spectrum...
Kawasaki, Tadahiro, Taya, Masaki, Takai, Yoshizo
Atomic structures of an Au (110) 2 × 1 reconstructed surface were analysed quantitatively using an exit wave reconstructed by the three‐dimensional Fourier filtering method in...
Dynamic Observation of an Atom-Sized Gold Wire by Phase Electron Microscopy (2001)
Ikuta, Takashi, Kawasaki, Tadahiro, Kimura, Yoshihide, Shimizu, Ryuichi, Takai, Yoshizo
Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum (2001)
Kawasaki, Tadahiro, Takai, Yoshizo, Ikuta, Takashi, Shimizu, Ryuichi
A method to obtain a nano‐area electron diffraction pattern in transmission electron microscopy (TEM) was proposed, based on three‐dimensional (3D) image formation theory. This method...
Fourier analysis of HRTEM image deterioration caused by mechanical vibration (2001)
Kawasaki, Tadahiro, Kimura, Yoshihide, Takai, Yoshizo, Shimizu, Ryuichi
Contrast deterioration of high‐resolution transmission electron microscope (HRTEM) images, that is caused by mechanical vibrations of the turbo molecular pump (TMP), was systematically and...
Kimura, Yoshihide, Takai, Yoshizo, Kawasaki, Tasahiro, Shimizu, Ryuichi, Ikuta, Takashi, Isakozawa, Shigeto, ...
A real-time ‘defocus image modulation processing electron microscope’ (DIMP-EM) has been developed by the ‘Research for the Future Program’ which was started in 1996 by the Japan Society for...
Takai, Yoshizo, Kimura, Yoshihide, Ikuta, Takashi, Shimizu, Ryuichi, Sato, Yuji, Isakozawa, Shigehito, ...
A real-time defocus-image modulation processing lectron microscope, which utilizes a custom designed, floating type, accelerating voltage generation system to modulate focus quickly and precisely,...
Optimization of voltage axis alignment in high-resolution electron microscopy (1999)
Utsuro, Hidetoshi, Takai, Yoshizo, Ikuta, Takashi, Shimizu, Ryuichi
An improved method for optimizing the voltage axis alignment is proposed. This method is based on averaging of the through-focus images by vibrating the accelerating-voltage rapidly, referred to as...
Evaluation of image drift correction by three-dimensional Fourier analysis (1999)
Kawasaki, Tadahiro, Utsuro, Hidetoshi, Takai, Yoshizo, Shimizu, Ryuichi
The cross-correlation function has been applied to correct linear and random image drifts included in a through-focus series of images. A novel method based on three-dimensional Fourier analysis is...
Interface States in ZnO Varistor with Mn, Co, and Cu Impurities. (1998)
Yano, Yoshihiko, Takai, Yoshizo, Morooka, Hisao
The interface states in ZnO with impurities of transition-metals, Mn, Co, and Cu, were investigated by the DLTS (deep-level transient spectroscopy) measurements in ZnO/PrCoO(x)/ZnO junctions as model...
Yoshizo Takai, Hidetoshi Utsuro, Yoshihide Kimnra, Takashi Ikuta, Ryuichi Shimizu
Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
Takai, Yoshizo, Utsuro, Hidetoshi, Kimura, Yoshihide, Ikuta, Takashi, Shimizu, Ryuichi
Preliminary experimental results for realizing real-time defocus-image modulation processing in a high-resolution transmission electron microscope are reported in terms of equivalence between...
Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM (1998)
Akita, Tomoki, Nagata, Takanori, Kimura, Yoshihide, Takai, Yoshizo, Shimizu, Ryuichi
Clean surfaces of aluminum obtained by repeated sputter-cleaning and annealing were observed using UHV-reflection electron microscopy (REM) equipped with an infrared heating apparatus and an in situ...
Ando, Toshiyuki, Taniguchi, Yoshifumi, Takai, Yoshizo, Kimura, Yoshihide, Shimizu, Ryuichi, Ikuta, Takashi
Real-time phase-plateless electron phase microscopy based on active image processing has been developed by utilizing accelerating-voltage modulation. This new method is based on the real-time...
Determination of Partially Coherent Parameters by Lattice Image Contrast in TEM (1993)
Takai, Yoshizo, Taniguchi, Yoshifumi, Shimizu, Ryuichi
A new method is proposed to measure a beam divergence angle and chromatic defocus spread in a transmission electron microscope. In the proposed method, these two parameters are determined by the...
A Method for Measuring Film Thickness by Zone Axis Contrast of TEM Image (1992)
The thickness of a bending thin film was determined by the comparison of the observed contrast of zone axis patterns with the calculated contrast based on a dynamical electron diffraction theory....