Youhua Shi

Publication List Details

Period

2004 - 2008

Number

7

Co-Authors

A Secure Test Technique for Pipelined Advanced Encryption Standard (2008)

SHI, Youhua, TOGAWA, Nozomu, YANAGISAWA, Masao, OHTSUKI, Tatsuo

In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method...

A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss (2008)

SHI, Youhua, TOGAWA, Nozomu, YANAGISAWA, Masao, OHTSUKI, Tatsuo

This paper presents a unified test compression technique for scan stimulus and unknown masking data with seamless integration of test generation, test compression and all unknown response masking for...

FCSCAN: An efficient multiscan-based test compression technique for test cost reduction (2006)

Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki

Abstract — This paper proposes a new multiscan-based test input data compression technique by employing a Fan-out Compression Scan Architecture (FCSCAN) for test cost reduction. The basic idea of...

Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains (2006)

SHI, Youhua, TOGAWA, Nozomu, KIMURA, Shinji, YANAGISAWA, Masao, OHTSUKI, Tatsuo

This paper presents a test input data compression technique, Selective Low-Care Coding (SLC), which can be used to significantly reduce input test data volume as well as the external test channel...