Z. Liliental-Weber

Publication List Details

Period

1989 - 2008

Number

65

Co-Authors

Relation between structural and optical properties of InN and InxGa1-xN thin films (2008)

Liliental-Weber, Z., Zakharov, D.N., Jasinski, J., Yu, K.M., Wu, J.W., Ager III, J.W., ...

Transmission Electron Microscopy (TEM) and optical measurements obtained from InN and In1-xGaxNfilms (0 < x < 0.54) grown by Molecular Beam Epitaxy are presented. Energy gaps measured byabsorption,...

Orthodox etching of HVPE-grown GaN (2007)

Weyher, J.L., Lazar, S., Macht, L., Liliental-Weber, Z., Molnar, R.J., Müller, S., ...

Orthodox etching of HVPE-grown GaN in molten eutectic of KOH+ NaOH (E etch) and in hot sulfuric and phosphoric acids (HH etch) is discussed in detail. Three size grades of pits are formed by the...

Tunable Intersublevel Transitions in Self-forming Semiconductor Quantum Dots (2004)

Leon, R., Fafard, S., Piva, P., Ruvimov, S., Liliental-Weber, Z.

Interfacial compositional disordering in InGaAs/GaAs quantom dots has been used to tune their intersublevel energy spaceings (delta E subscript [(i + 1) - i]).

Electrical properties of inalp native oxides for metal-oxide-semiconductor device applications (2004)

Cao, Y., Zhang, J., Li, X., Kosel, T.H., Fay, P., Hall, D.C., ...

Data are presented on the insulating properties and capacitance-voltage (CV) characteristics of metal-oxide-semiconductor (MOS) device-thickness (below approx. 100 nm) native oxides formed by wet...

Influence of Mg and In on defect formation in GaN; bulk and MOCVD grown samples (2000)

Liliental-Weber, Z., Benamara, M., Jasinski, J., Swider, W., Washburn, J., Grzegory, I., ...

Transmission electron microscopy studies were applied to study GaN crystals doped with Mg. Both: bulk GaN:Mg crystals grown by a high pressure and high temperature process and those grown by...

Influence of low temperature-grown GaAs on lateral thermal oxidation of Al0.98Ga0.02As (2000)

Ferrer, J.C., Liliental-Weber, Z., Reese, H., Chiu, Y.J., Hu, E.

The lateral thermal oxidation process of Al0.98Ga0.02As layers has been studied by transmission electron microscopy. Growing a low-temperature GaAs layer below the Al0.98Ga0.02As has been shown to...

On the dynamic nature of microscopy specimens at lattice resolution (1989)

Washburn, J., Liliental-Weber, Z.

Examples are shown that illustrate rapid changes that can take place while a thin foil specimen is under observation in a high-voltage microscope. These unusually dramatic examples emphasize the fact...

On the dynamic nature of microscopy specimens at lattice resolution (1989)

Washburn, J., Liliental-Weber, Z.

Examples are shown that illustrate rapid changes that can take place while a thin foil specimen is under observation in a high-voltage microscope. These unusually dramatic examples emphasize the fact...

On the dynamic nature of microscopy specimens at lattice resolution (1989)

Washburn, J., Liliental-Weber, Z.

Examples are shown that illustrate rapid changes that can take place while a thin foil specimen is under observation in a high-voltage microscope. These unusually dramatic examples emphasize the fact...